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The Effects of Electrical Contacts Degradation on High Frequency Behavior of RF Connectors

Acknowledgements第5-6页
Dedication第6-7页
Abstract第7页
摘要第8-13页
List of Abbreviations第13-14页
Chapter 1: Introduction and Literature Review第14-25页
    1.1 Introduction第14-15页
    1.2 Background Study第15-16页
    1.3 Literature Review第16-22页
    1.4 Research Study Contribution第22-23页
    1.5 Thesis Report Organization第23-25页
Chapter 2: Basic Research Foundation and Electrical Contacts Theory第25-34页
    2.1 Introduction第25-26页
    2.2 Basic Electrical Contact Principle第26-27页
    2.3 Corrosion Mechanism and Types第27-29页
        2.3.1 Gold Pore Corrosion Mechanism第28-29页
    2.4 Metallographic Analysis of Pin第29-31页
    2.5 Skin Effect and Skin Depth第31-33页
    2.6 Summary第33-34页
Chapter 3: Electromagnetic Field Simulation Model of SMA Connector第34-46页
    3.1 Introduction第34页
    3.2 Computer Simulation Technology (CST)第34-35页
    3.3 Scattering Parameters第35-37页
    3.4 3D Electromagnetic Model of Connector第37-39页
    3.5 CST Simulation Model Results第39-42页
        3.5.1 S Parameters Simulation Model Results第39-41页
        3.5.2 3D Surface Current Simulation Model Results第41-42页
    3.6 Voltage Standing Wave Ratio (VSWR)第42-45页
    3.7 Summary第45-46页
Chapter 4: Equivalent Circuit Impedance Model of Degraded Electrical Contact Surface第46-57页
    4.1 Introduction第46-47页
    4.2 Transmission Line Theory第47-50页
    4.3 Equivalent Circuit Model Development第50-53页
    4.4 ADS Circuit Model Simulation Results第53-55页
    4.5 Summary第55-57页
Chapter 5: Experimental Verification and Vector Network Analyzer Measurements第57-66页
    5.1 Introduction第57页
    5.2 Degraded SMA Connector Samples第57-59页
    5.3 Vector Network Analyzer (VNA)第59-61页
    5.4 Experimental VNA Results第61-63页
    5.5 Comparison of Simulated and Measured Results第63-65页
    5.6 Summary第65-66页
Chapter 6: Conclusion and Future Recommendation Work第66-68页
    6.1 Conclusion第66-67页
    6.2 Future Recommendation Work第67-68页
List of Publications第68-69页
References第69-72页

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