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一维微/纳米结构的热辐射特性调控及应用

摘要第4-7页
Abstract第7-9页
List of Symbols and Abbreviations第17-20页
Chapter 1 Introduction第20-40页
    1.1 Background第20-22页
    1.2 Light Emitting Diodes第22-24页
    1.3 Thermophotovoltaic第24-36页
        1.3.1 TPV System Efficiency第27-28页
        1.3.2 The Emitter第28-32页
        1.3.3 The Filter第32-34页
        1.3.4 The TPV Cell第34-36页
    1.4 Numerical Method第36-38页
    1.5 Thesis Scope第38页
    1.6 Methodology第38页
    1.7 Thesis Organization第38-40页
Chapter 2 Numerical Method and Modeling第40-61页
    2.1 Introduction第40页
    2.2 One-Dimensional Rigorous Coupled-wave Analysis Method第40-41页
    2.3 Rigorous Coupled-Wave Analysis Method for TE Wave第41-48页
    2.4 Boundary Conditions第48-49页
    2.5 Rigorous Coupled-Wave Analysis for TM Wave第49-53页
    2.6 Rigorous Coupled-Wave Analysis for Conical Diffraction第53-61页
Chapter 3 Tailoring the Emission/Transmission Spectra of Micro/Nanostructures第61-79页
    3.1 Introduction第61页
    3.2 Selective Emitter第61-74页
        3.2.1 Comparison and Simulation for Gratings Selective Emitter第61-67页
        3.2.2 Comparison and Simulation for Multilayer Selective Emitter第67-70页
        3.2.3 Comparison and Simulation of Complex gratings Selective Emitter第70-74页
    3.3 Selective Filter第74-79页
        3.3.1 Comparison and Simulation for Multilayer Selective Filter第74-75页
        3.3.2 Simulation for Multilayer Selective Filter第75-79页
Chapter 4 Enhancement of BRDF/BTDF Properties using Nanostructures第79-105页
    4.1 Introduction第79-80页
    4.2 Comparison and Simulation for Top Micro/nanostructures gratings LEDs第80-86页
        4.2.1 Numerical Study by RCWA第80-84页
        4.2.2 Comparison of the Results by Different Methods第84-86页
    4.3 Simulation of the Top Micro/Nanostructures Gratings LEDs第86-89页
    4.4 Simulation of the Bottom Micro/Nanostructures Gratings LEDs第89-92页
    4.5 Three Axis Automated Scatterometer Instrument第92-97页
    4.6 Effect of the Polarization on the BRDF and BTDF of the Samples第97-100页
        4.6.1 BRDF Measurements for 1D 5-layer W/SiO_2 Sample第97-98页
        4.6.2 BRDF Measurements for 1D 8-layer Si/SiO_2 Sample第98-99页
        4.6.3 BTDF Measurements for 1D 8-layer Si/SiO_2 Sample第99-100页
    4.7 Effect of the Plane of Incidence on the BRDF of the Samples第100-105页
        4.7.1 Effect of the Plane of Incidence on the BRDF of 1D 5-layer W/SiO_2 Sample第100-102页
        4.7.2 Effect of the Plane of Incidence on BRDF of 1D 8-layer Si/SiO_2 Sample第102-105页
Chapter 5 Radiative Properties Measurements of Emitter and Filter with Nanostructures第105-129页
    5.1 Introduction第105页
    5.2. Instrumentation第105-115页
        5.2.1 Magnetron Sputtering第105-108页
        5.2.2 Ion Etching Coating System第108-110页
        5.2.3 Scanning Electron Microscopy第110-113页
        5.2.4 The Spectral Transmittance and Reflectance Measurement System第113-115页
    5.3 Selective Emitter and Filter Design and Fabrication第115-117页
    5.4 Emittance Measurements for 1D 5-layer W/SiO_2 Sample第117-121页
    5.5 Reflectance Measurements for 1D 8-layer Si/SiO_2 Sample第121-123页
    5.6 Transmittance Measurements for 1D 8-layer Si/SiO_2 Sample第123-125页
    5.7 TPV System Performance第125-127页
    5.8 TPV System Optimization Design第127-129页
Conclusions and Recommendations第129-135页
    6.1 Conclusions第129-134页
    6.2 Suggestions for Further Research第134-135页
References第135-150页
List of publications during the period of Ph.D. education第150-154页
Acknowledgements第154-155页
Resume第155页

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