| 前言 | 第1-5页 |
| Preface | 第5-9页 |
| Acknowledgements | 第9-15页 |
| 1 Introduction | 第15-35页 |
| ·The Nature of VLSI Devices | 第15-19页 |
| ·Digital,Analog and Mixed-Signal | 第15-16页 |
| ·Device Classifications | 第16-17页 |
| ·Device Technologies | 第17-18页 |
| ·Device Manufacturing | 第18-19页 |
| ·The Development of Test Technology | 第19-31页 |
| ·The Hardware of Test Systems | 第21-26页 |
| ·The Software of Test Systems | 第26-31页 |
| ·Test Economics | 第31-33页 |
| ·Concluding Remarks | 第33-35页 |
| 2 OLDEVDTP:An Off-Line Debugging Environment for VLSI Device Test Programs | 第35-51页 |
| ·The Analyses of Existing Tools | 第35-39页 |
| ·The Overview of OLDEVDTP | 第39-43页 |
| ·Creation and Debugging of Device Test Programs with OLDEVDTP | 第43-45页 |
| ·Challenges in Design and Implementation of OLDEVDTP | 第45-49页 |
| ·Concluding Remarks | 第49-51页 |
| 3 Fuzzy Comprehensive Evaluation and its Applications to Test Programs Debugging | 第51-73页 |
| ·Introduction to Fuzzy Mathematics | 第51-59页 |
| ·Definition of Fuzzy Sets | 第53-54页 |
| ·Basic Operations | 第54-57页 |
| ·Fuzzy Relations and Fuzzy Transformation | 第57-59页 |
| ·Mathematical Models of Fuzzy Comprehensive Evaluation(FCE) | 第59-65页 |
| ·The Applications of FCE to Test Programs Debugging | 第65-72页 |
| ·Construction of a Device Test Program | 第65页 |
| ·Determination of FCE Model for Selection of Entities to Be Debugged | 第65-72页 |
| ·Concluding Remarks | 第72-73页 |
| 4 The Membership Functions of the Program Error Type Evaluation Factors | 第73-83页 |
| ·Introduction to Probability and Statistics | 第73-77页 |
| ·The Membership Functions of the Evaluation Factors | 第77-81页 |
| ·Concluding Remarks | 第81-83页 |
| 5 Fuzzy Inference | 第83-93页 |
| ·The Algorithm of Selection of the Entities to Be Debugged | 第83-86页 |
| ·An Example | 第86-91页 |
| ·Concluding Remarks | 第91-93页 |
| 6 The Analysis and Design of OLDEVDTP | 第93-107页 |
| ·The Analysis and Design of the Detector | 第93-101页 |
| ·The Analysis of the Detector | 第94-98页 |
| ·The Organization of the Test Program | 第94-97页 |
| ·The Occurrence Ways of Program Errors | 第97-98页 |
| ·The Design of the Detector | 第98-101页 |
| ·The Design and Verification of the Simulator | 第101-106页 |
| ·The Analysis and Design of the Simulator | 第102-105页 |
| ·The Verification of the Simulator | 第105-106页 |
| ·Concluding Remarks | 第106-107页 |
| 7 The Implementation of the Detector | 第107-119页 |
| ·The Environments of Hardware and Software | 第108-109页 |
| ·The Design of Algorithms | 第109-115页 |
| ·The Features of the Detector | 第115-117页 |
| ·Concluding Remarks | 第117-119页 |
| 8 Conclusions and Future Work | 第119-123页 |
| Bibliography | 第123-137页 |
| Published Papers | 第137-139页 |
| Autobiographical Notes | 第139页 |
